Dynamic Motion Technology

제품정보

    3067120794_aGNd6w4A_bd1a78c5e33124d3929b0399ca07f2feb1330568.png

    제품소개 > SEMI

    Stacked X/Y/T stage
    SEM(Vacuum), Metrology
    제품문의하기 목록으로
    상세정보
    Structure: Stacked X/Y/T stage
    Application: SEMI-200mm
    Overlay Metrology
    OCD, …
    Specifications:
    Travel:  270 * 270 * 360°
    Max. Acceleration: 0.5G
    Max. Velocity: 300mm/s
    Bi-dir. Repeatability: ±200nm
    Straightness: ±2.0um
    Flatness: ±2.0um
    In position stability: < ±2.0nm, < ±5.0nm(T)
    Fine Theta(Align)
    Lead time: 14 weeks (production)
    Prototype: 2017 ~