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제품소개 > SEMI
Stacked X/Y/T stage - SEM(Vacuum), Metrology
상세정보
Structure: Stacked X/Y/T stage
Application: SEMI-200mm
Application: SEMI-200mm
•Overlay Metrology
•OCD, …
Specifications:
•Travel: 270 * 270 * 360°
•Max. Acceleration: 0.5G
•Max. Velocity: 300mm/s
•Bi-dir. Repeatability: ±200nm
•Straightness: ±2.0um
•Flatness: ±2.0um
•In position stability: < ±2.0nm, < ±5.0nm(T)
•Fine Theta(Align)
Lead time: 14 weeks (production)
•Prototype: 2017 ~